Universal Docking System

摘要

An apparatus for quickly and reliably aligning a semiconductor handling apparatus with a semiconductor tester. Two docking plates are attached, one to the device handler and one to the device tester. On the docking plates a substructure is mounted which first allows initial alignment of the handler plate with the test head plate after which the substructure provides the means of securely positioning and interlocking the handler plate with the test head.