发明名称 |
Semiconductor integrated circuit including test facilitation circuit and test method thereof |
摘要 |
A semiconductor integrated circuit and method of use improve a rate of defect detection and also facilitate production of test patterns while suppressing an increase of the circuit area. The semiconductor integrated circuit includes a plurality of pairs of a sequence circuit and selector circuit. Each of the sequence circuits stores an operation result of an internal circuit, whereas each selector circuit is responsive to a control signal for selecting one of the data stored in its associated sequence circuit and an inverted version of the data to thereby output the selected data. A control circuit operates to count up or divide clocks and then control the selector circuits constituting the plurality of pairs in accordance with the resultant count values.
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申请公布号 |
US6272656(B1) |
申请公布日期 |
2001.08.07 |
申请号 |
US19980172160 |
申请日期 |
1998.10.14 |
申请人 |
KAWASAKI STEEL CORPORATION |
发明人 |
YOSHIYAMA MASAYUKI |
分类号 |
G01R31/28;G01R31/3185;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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