发明名称 |
Epitaxial wafer having a gallium nitride epitaxial layer deposited on semiconductor substrate and method for preparing the same |
摘要 |
The present invention provides an epitaxial wafer comprising a (111) substrate of a semiconductor having cubic crystal structure, a first GaN layer having a thickness of 60 nanometers or more, a second GaN layer having a thickness of 0.1 mum or more and a method for preparing it.
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申请公布号 |
US6270587(B1) |
申请公布日期 |
2001.08.07 |
申请号 |
US19980041109 |
申请日期 |
1998.03.12 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
MOTOKI KENSAKU;MATSUSHIMA MASATO;AKITA KATSUSHI;SHIMAZU MITSURU;TAKEMOTO KIKUROU;SEKI HISASHI;KOUKITU AKINORI |
分类号 |
C30B29/38;C30B29/42;H01L21/20;H01L33/00;H01L33/12;H01L33/16;H01L33/32;(IPC1-7):H01L29/12 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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