发明名称 METHOD FOR RECOGNIZING WAFER ID
摘要 PURPOSE: A method for recognizing a wafer ID is provided to recognize the ID of the wafer by a wafer recognizer before providing the wafer to a manufacturing apparatus in order to manage the recognition of ID for separate wafers. CONSTITUTION: The wafer ID recognizing method applies to a manufacturing control system includes a manufacturing apparatus(240), an apparatus server(220), a wafer recognizer(230) and a wafer history managing database. The manufacturing apparatus contains a wafer in a wafer cassette with an ID(identification) and performs the process. The apparatus server is coupled with the manufacturing apparatus. The wafer recognizer is coupled with the apparatus server. The wafer history managing database stores a comparison table including information of the wafer whose ID is recognized by the wafer recognizer. At first step, the information of the wafer is registered by using the ID. Then, the ID is read by using the wafer recognizer while the process is performed by the manufacturing apparatus. At third, the information of the wafer is recognized by using the ID and the data stored in the comparison table.
申请公布号 KR20010074358(A) 申请公布日期 2001.08.04
申请号 KR20000003386 申请日期 2000.01.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SEOK HUI;SIM, HYEON SIK
分类号 H01L23/544;(IPC1-7):H01L23/544 主分类号 H01L23/544
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