| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of testing the whole of the integrated circuit according to SCAN signal input in the integrated circuit device even that internal circuits have employed a multitude of SCAN style. SOLUTION: The device includes two or more logic blocks (core 30, 50 and UDL 40) provided with a multitude of SCAN cells for testing and applied by different SCAN style, and a SCAN signal conversion circuit 100, which is connected to the logic block, for converting input SCAN signal corresponding to either one of the logic blocks to a variety of SCAN signals for controlling the shift and normal functioning of the logic blocks.
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