发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To provide a contact probe of a long life which prevents deformation of a contact and short-circuit between contacts and can perform electric continuity inspection accurately, in electric continuity inspection of electronic components on a printed board. SOLUTION: A hollow cylinder guide part 8 composed of electric insulating oleo-resin which is coupled with the outer diameter of a tip part 11 of the contact 1 and engaged with the outer diameter of a receptacle 6 is installed. When the contact 1 is made to descend, the contact is made to slide between the guide part 8 and the outer diameter of the receptacle 6.
申请公布号 JP2001208771(A) 申请公布日期 2001.08.03
申请号 JP20000014982 申请日期 2000.01.24
申请人 NEC YONEZAWA LTD 发明人 OGASAWARA KAZUTERU
分类号 G01R1/067;G01R31/02;(IPC1-7):G01R1/067 主分类号 G01R1/067
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