发明名称 INSPECTION METHOD AND APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To accurately inspect periodically repeating patterns on an object for their configuration. SOLUTION: Based on an original image with three or more gradations obtained by an image pickup device, an image shifting device 72 provides (N-1) shifted images which are formed when the original image is shifted by integer times of repeating cycles in the repeating direction of a specific pattern. A pattern formation information computing device 73 causes data points matching positions in an area where N images consisting of the original image and the (N-1) shifted images overlap one another to be positioned in an N-dimensional coordinate space while using a set of gradation values at the same position in each of the N images as data points in the N-dimensional coordinate space. Information about the patterns formed on the object is obtained with accuracy from the condition of the distribution of the data points in the N-dimensional coordinate space.</p>
申请公布号 JP2001208700(A) 申请公布日期 2001.08.03
申请号 JP20000018188 申请日期 2000.01.27
申请人 NIKON CORP 发明人 YOSHIDA KOJI
分类号 G01B11/30;G01M11/00;G01N21/956;G01N23/225;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01B11/30
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