发明名称 ADDITIONAL SPECIMEN REGISTRING FUNCTION IN AUTOMATIC ANALYZER
摘要 PROBLEM TO BE SOLVED: To prevent an inspector from overlooking the analysis of an additional specimen by giving an additional specimen registering function to an automatic analyzer and to liberate the inspector from the necessity of always watching the state of the analyzer to avoid the occurrence of an omission of reporting due to overlooking of the analysis of an additional specimen. SOLUTION: This additional specimen registering function is constituted in such a way that the presence/absence of analysis on an additional specimen is discriminated by detecting the registration completion/cancellation of the additional specimen on the automatic analyzer side. In addition, the additional specimen can be registered by using the analysis starting position of the specimen set on a sample desk so that specimen management can be performed in such a way that whether or not the additional specimen is set up on the sample desk for analysis by the inspector can be discriminated.
申请公布号 JP2001208758(A) 申请公布日期 2001.08.03
申请号 JP20000021742 申请日期 2000.01.26
申请人 HITACHI LTD 发明人 ONOSE KAZUHIRO
分类号 G01N35/00;(IPC1-7):G01N35/00 主分类号 G01N35/00
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