发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR FILM HAVING CHARACTERISTIC IN WITHSTAND VOLTAGE
摘要 PROBLEM TO BE SOLVED: To provide the manufacturing method of a semiconductor thin film, which can conduct inactive processing and cleaning processing, on an exposed part in the p-n junction face of the semiconductor thin film in a short time at a room temperature and has the characteristic in withstand voltage of high productivity. SOLUTION: A second conductive SiGe film is laminated on a first conductive Si substrate. The p-n junction face is exposed by etching. A laminated body in a state where the p-n junction face is exposed is irradiated with an ultraviolet ray and the cleaning processing and the inactive processing are conducted.
申请公布号 JP2001210654(A) 申请公布日期 2001.08.03
申请号 JP20000020153 申请日期 2000.01.28
申请人 MITSUBISHI HEAVY IND LTD 发明人 NAKANO KOUJI
分类号 H01L29/73;H01L21/329;H01L21/331;H01L29/165;(IPC1-7):H01L21/331 主分类号 H01L29/73
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