发明名称 ELEMENT ANALYZER
摘要 <p>PROBLEM TO BE SOLVED: To provide an element analyzer preventing the penetration of a scattered proton,γ-ray and excessive characteristic X-rays into an X-ray detector to accurately analyze elements and capable of being adapted to heavy and light elements without being adjusted. SOLUTION: An X-ray detector 4 for heavy elements and an X-ray detector 5 for light elements are provided in a vacuum chamber. An absorber 6 for cutting offγ-ray and restricting the penetration quantity of X-rays is mounted on the leading end of the sleeve 4a of the detector and a scattered proton remover 10 is provided in the leading end of the sleeve 5a of the detector 5 in addition to the absorber 6. The absorber 6 is equipped with aγ-ray shield cylinder 7 having a cover cylinder 7b made of lead and a collimator 8 for closing the open part of the cylinder. The penetration quantity of X-rays into the sleeve 4a is adjusted by an aperture 8c. The main body 11 of the remover 10 has two permanent magnet plates 14 of which the magnetic poles are opposed to each other. A passage 16 passes the gap between the permanent magnet plates 14 to communicate with a fitting cylinder 12. The periphery of the passage 16 is surrounded by a cover wall made of a synthetic resin and a magnetic field is formed in the passage. The outer peripheries of the permanent magnet plates 14 are covered with an iron yoke 15 to prevent the leak of magnetic flux.</p>
申请公布号 JP2001208707(A) 申请公布日期 2001.08.03
申请号 JP20000018844 申请日期 2000.01.27
申请人 ION KASOKUKI KK 发明人 WAKASA HIDEICHIRO;SASAKI TARO
分类号 G01N23/225;(IPC1-7):G01N23/225 主分类号 G01N23/225
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