发明名称 TEST SYSTEM
摘要 PROBLEM TO BE SOLVED: To conduct an exact performance test for a machine to be tested by adding loss in signal path and automatically correcting test signals. SOLUTION: A test system conducts a performance test of a machine 13 to be tested by impressing a test signal from a signal generator 12 controlled with a controller 11 to the machine 13. It is provided with a signal switcher 14 on the signal path from a signal generator 12 to the test piece and the one output from the signal generator is connected to the machine 13 and the other output is connected to a measuring apparatus 15 for measuring the test signal. Prior to the test, the controller 11 switches the signal switcher 14 to input the test signal to the measuring apparatus 15 and evaluate whether the measured signal fulfills a specific standard, corrects the test signal by controlling the signal generator 12 when it does not fulfill the specific standard, switches the signal switcher 14 to input the test signal to the machine 13 to be tested and conduct the test.
申请公布号 JP2001208787(A) 申请公布日期 2001.08.03
申请号 JP20000014714 申请日期 2000.01.24
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 NAKAJIMA AKIHIRO
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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