发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fabrication method of semiconductor devices is provided to easily control a diameter of contact holes and to improve an alignment margin by planarizing an interlayer dielectric using a plug. CONSTITUTION: After forming gates(34) on a semiconductor substrate(31), source and drain regions(36,36-1) are formed by implanting dopants using the gates as a mask. A first and a second contact holes are formed to expose the source and drain regions by depositing and patterning a first interlayer dielectric(37). A storage electrode(39) is filled into the second contact hole so as to connect to the drain region(36-1), and a dielectric film(40) is formed on the storage electrode(39). A plate electrode(41) is formed on the dielectric film(40) and a plug(42) is simultaneously formed into the first contact hole so as to connect to the source region(36). A second interlayer dielectric(43) having a third contact hole is formed on the resultant structure. A metal interconnection(45) is formed to connect to the plug(42).
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申请公布号 |
KR100305878(B1) |
申请公布日期 |
2001.08.02 |
申请号 |
KR19980002351 |
申请日期 |
1998.01.26 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
SON, DAE HUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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