发明名称 Verfahren und Vorrichtung zur Messung insbesondere von Oberflächentopologien in mikroskopischer Auflösung
摘要 The start of the displacement movement is initiated by a software instruction (2, 3) when measuring surface topologies with microscopic resolution. Trigger pulses which serve to trigger the recording of measured values on the sensor (1) are generated in discrete local intervals by a position transmitter. The measured values obtained are stored and then asynchronously transmitted to the controller (4).
申请公布号 DE10001800(A1) 申请公布日期 2001.08.02
申请号 DE20001001800 申请日期 2000.01.18
申请人 OM ENGINEERING GMBH 发明人 VALENTIN, JUERGEN;GRIGAT, MARCUS;SCHREIER, HANS-HERMANN
分类号 G01B11/00;G01B21/30;(IPC1-7):G01B21/30;G01B11/30;G12B21/20 主分类号 G01B11/00
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