发明名称 |
Verfahren und Vorrichtung zur Messung insbesondere von Oberflächentopologien in mikroskopischer Auflösung |
摘要 |
The start of the displacement movement is initiated by a software instruction (2, 3) when measuring surface topologies with microscopic resolution. Trigger pulses which serve to trigger the recording of measured values on the sensor (1) are generated in discrete local intervals by a position transmitter. The measured values obtained are stored and then asynchronously transmitted to the controller (4).
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申请公布号 |
DE10001800(A1) |
申请公布日期 |
2001.08.02 |
申请号 |
DE20001001800 |
申请日期 |
2000.01.18 |
申请人 |
OM ENGINEERING GMBH |
发明人 |
VALENTIN, JUERGEN;GRIGAT, MARCUS;SCHREIER, HANS-HERMANN |
分类号 |
G01B11/00;G01B21/30;(IPC1-7):G01B21/30;G01B11/30;G12B21/20 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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