发明名称 Electrical mask identification of memory modules
摘要 Mask programmable conductors of the same construction as the mask layers they define are utilized for mask vintage identification. When the actual mask layer is altered, the change is recorded within the mask itself.Mask identification can be fabricated to identify the following type of mask layers: DT-deep trench; SS-surface strap; DIFF-Diffusion; NDIFF-N Diffusion; PDIFF-P Diffusion; WL-N wells; PC-polysilicon gates; BN-N diffusion Implant; BP-P diffusion Implant; C1-first contact; M1-first metal layer; C2-second contact; and, M2-second metal layer.Conducting paths that incorporate, in series, the mask programmable conductor technology devices are: M1-C1-PC-C1-DIFF-C1-M1-C2-M2; M1-C1-PDIFF-SS-DT-SS-PDIFF-C1-M1-C2-M2; M2-C2-M1-C1-PC-C1-M1; M2-C2-M1-C1-NDIFF-WL-NDIFF-C1-M1; and, M2-C2-M1-C1-NDIFF-C1-M1-C1-PC-C1-M1. These conducting paths are electrically opened with the omission of any of the layers in the series path.
申请公布号 US6268228(B1) 申请公布日期 2001.07.31
申请号 US19990238874 申请日期 1999.01.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DEFORGE JOHN B.;DOUSE DAVID E.;EUSTIS STEVEN M.;HEDBERG ERIK L.;LITTEN SUSAN M.;THOMA ENDRE P.
分类号 G03F7/20;(IPC1-7):H01L21/66 主分类号 G03F7/20
代理机构 代理人
主权项
地址