发明名称 Internal clock generating circuit of synchronous type semiconductor memory device and method thereof
摘要 An internal clock generating circuit of a synchronous type semiconductor memory device includes a transmission part for transmitting a first clock enable signal in response to applying a first level of a first clock signal. It also includes a latch part for latching the first clock enable signal transmitted from the transmission part. A gating part gates the latched first clock enable signal with the first clock signal to generate a second clock signal as an internal clock signal for the memory device. This reduces a time lag by which the speed of the internal clock is synchronized with the external clock signal.
申请公布号 US6269050(B1) 申请公布日期 2001.07.31
申请号 US20000594888 申请日期 2000.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON KOOK-HWAN;NOH YONG-HWAN
分类号 G11C11/413;G11C7/22;G11C11/402;G11C11/407;(IPC1-7):G11C8/00 主分类号 G11C11/413
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