发明名称 |
Internal clock generating circuit of synchronous type semiconductor memory device and method thereof |
摘要 |
An internal clock generating circuit of a synchronous type semiconductor memory device includes a transmission part for transmitting a first clock enable signal in response to applying a first level of a first clock signal. It also includes a latch part for latching the first clock enable signal transmitted from the transmission part. A gating part gates the latched first clock enable signal with the first clock signal to generate a second clock signal as an internal clock signal for the memory device. This reduces a time lag by which the speed of the internal clock is synchronized with the external clock signal.
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申请公布号 |
US6269050(B1) |
申请公布日期 |
2001.07.31 |
申请号 |
US20000594888 |
申请日期 |
2000.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON KOOK-HWAN;NOH YONG-HWAN |
分类号 |
G11C11/413;G11C7/22;G11C11/402;G11C11/407;(IPC1-7):G11C8/00 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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