发明名称 Method for testing electronic components
摘要 A device (1) has a processor (13) capable of controlling test equipment (2) to carry out repeatedly at least some of its steps, each time reducing the duration of at least one of the steps until satisfying a final criterion taking into account the distribution of the electric variables measured by the equipment for each reduced duration value, and to set a new duration value at most equal to its initial value, for which the measured electric variable distribution satisfies one selected dispersion condition. The device has a function generator (14) capable of providing a function applicable to at least one of the terms of a comparison executed during one of the steps, so that the function operates on a measurement executed after the new duration.
申请公布号 US6269326(B1) 申请公布日期 2001.07.31
申请号 US19980194029 申请日期 1998.11.16
申请人 SOFTLINK 发明人 LEJEUNE PHILIPPE
分类号 G01R31/26;G01R31/28;G01R31/30;G01R31/317;G01R35/04;H01L21/66;(IPC1-7):G06F17/30 主分类号 G01R31/26
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