Semiconductor device and method of fabricating the same

摘要

A DRAM control circuit or a test circuit describing a delay control cell is prepared. Automatic placement and routing is performed in relation to this circuit. Circuit simulation is executed at a step ST16. Delay control is performed with the delay control cell on the basis of a simulation result. Alternatively, delay control is performed with a circuit of the delay control cell on the basis of a test result. Thus, automatic placement and routing of at least either the DRAM control circuit or the test circuit provided in a DRAM is enabled.