发明名称 METHOD OF OBSERVING CROSS-SECTIONAL STRUCTURE OF SAMPLE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for obtaining a microscopic image clearly showing the original shape of a sample surface on the surface of the sample in a process of cross-sectional machining, for observation technologies for processing of and observing of a cross section to be observed using a focus ion beam apparatus. SOLUTION: A coating layer of a maternal different from that of the unprocessed surface of a sample is first formed on the surface of the sample, and deposition is then performed to form a protective layer. In addition, the part is then processed for cross section. This causes the coat layer of a different material which is interposed on the boundary between the original surface of the sample, and the part on which a protective layer is deposited and accumulated by means of deposition. In a microscope image, the existence of the coat layer of the different material can clearly show the original shape of the covering surface of the sample.</p>
申请公布号 JP2001202916(A) 申请公布日期 2001.07.27
申请号 JP20000010159 申请日期 2000.01.14
申请人 SEIKO INSTRUMENTS INC 发明人 SADAYAMA MASASHIGE
分类号 H01L21/8229;C23C16/04;G01N1/28;G01N1/32;G01N23/225;H01J37/28;H01J37/305;H01J37/31;(IPC1-7):H01J37/28 主分类号 H01L21/8229
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