| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated device incorporating a functions which is capable of dividing an internal circuit into a plurality of blocks and conducting a boundary test. SOLUTION: The semiconductor integrated device comprises a plurality of scanning cell groups connected in series to serially supply input data for testing a plurality of internal circuit bocks and to serially read output data from the plurality of the blocks, a selector inputting a first signal from one end of the group corresponding to at least one of the plurality of the blocks, inputting a second signal from the other end of the group, and outputting one of the first and second signals according to a control signal to thereby selecting whether the entirety or a part of the plurality of the blocks is tested; and a test control circuit for controlling a supply of the input data to the group and reading of the output data from the group according to a signal to be applied from an exterior, and supplying a control signal to the selector.
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