发明名称 SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor wafer, where the surface and the back can be easily distinguished with the naked eyes in the case of a semiconductor wafer whose both surfaces, the surface and the back, are subjected to mirror surface polishing. SOLUTION: In a semiconductor wafer, the surface and the back are subjected to mirror-finish polishing, and the outer peripheral surface is subjected to beveling work. Either of the surface side and the back side of the outer peripheral surface is subjected to tapered beveling work (oblique straight line beveling work).
申请公布号 JP2001203177(A) 申请公布日期 2001.07.27
申请号 JP20000013941 申请日期 2000.01.18
申请人 HITACHI CABLE LTD 发明人 SHIMADA TAKASHI
分类号 H01L21/304;H01L21/02;(IPC1-7):H01L21/304 主分类号 H01L21/304
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