发明名称 Metal etching process
摘要 A metal etching process. A glue/barrier layer, a metal layer and an anti-refeletion layer are formed on a substrate. A three-stage etching step is performed. A break through step of etching is performed to pattern the glue/barrier layer. A main etching step is performed on the metal layer with chlorine, boron trichloride, and trifluoro-methane as etching gases. The trifluoro-methane is advantageous to produce a polymer during etching, so that the profile of the metal layer appears atilt. An over-etching step is then performed to ensure an insulation between neighboring wiring lines.
申请公布号 US2001009248(A1) 申请公布日期 2001.07.26
申请号 US20010815752 申请日期 2001.03.23
申请人 KUO WEN-PIN;HO YUEH-FENG;LIN JY-HWANG 发明人 KUO WEN-PIN;HO YUEH-FENG;LIN JY-HWANG
分类号 B44C1/22;C23F4/00;H01L21/311;H01L21/3213;H01L21/768;(IPC1-7):B44C1/22;C23F1/00 主分类号 B44C1/22
代理机构 代理人
主权项
地址