发明名称 |
CONFORMAL THIN FILM ON CAPACITOR ELECTRODE SUBJECTED TO TEXTURE WORKING |
摘要 |
PURPOSE: To provide a method for forming a capacitor on an integrated circuit. CONSTITUTION: This method includes the construction of a bottom electrode containing a silicon layer subjected to texture working and the deposition of a dielectric layer on the silicon layer subjected to texture working, wherein the deposition includes the formation of a single layer on the texture-worked silicon layer by about 1 of the first material or less by the exposure to the first reactant seed and the leaving of a single layer of about 1 of the second material or less by the reaction of the second reactant seed with the first material. |
申请公布号 |
KR20010070264(A) |
申请公布日期 |
2001.07.25 |
申请号 |
KR20000072991 |
申请日期 |
2000.12.04 |
申请人 |
ASM MICROCHEMISTRY OY |
发明人 |
ERNST H. A. GURANNEMAN;HAUKA SUVI P.;IBO RAAIEEMAAKAA |
分类号 |
C23C16/24;C23C16/40;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
C23C16/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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