发明名称 CONFORMAL THIN FILM ON CAPACITOR ELECTRODE SUBJECTED TO TEXTURE WORKING
摘要 PURPOSE: To provide a method for forming a capacitor on an integrated circuit. CONSTITUTION: This method includes the construction of a bottom electrode containing a silicon layer subjected to texture working and the deposition of a dielectric layer on the silicon layer subjected to texture working, wherein the deposition includes the formation of a single layer on the texture-worked silicon layer by about 1 of the first material or less by the exposure to the first reactant seed and the leaving of a single layer of about 1 of the second material or less by the reaction of the second reactant seed with the first material.
申请公布号 KR20010070264(A) 申请公布日期 2001.07.25
申请号 KR20000072991 申请日期 2000.12.04
申请人 ASM MICROCHEMISTRY OY 发明人 ERNST H. A. GURANNEMAN;HAUKA SUVI P.;IBO RAAIEEMAAKAA
分类号 C23C16/24;C23C16/40;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 C23C16/24
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