SEMICONDUCTOR INTEGRATED CIRCUIT WITH CIRCUIT FUNCTION OF SELF-DIAGONOSTIC TEST AND TESTING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PURPOSE: To apply proper stress even to an I/O cell other than a terminal used for the output and input of a scan, at the time of a burn-in test using a scanning circuit. CONSTITUTION: An I/O cell 101 becomes an output at the time of a burn-in test by a burn-in test mode signal M, and the output of a port output signal setting resistor 106 is selected. A command to alternately set 'H' and 'L' is written in advance in a test ROM 102. 'H' and 'L' is outputted from the I/O cell at the time of the burn-in by this circuit setup, and proper stress can be applied to the I/O cell.