发明名称 |
PLASMA PROCESSING METHOD |
摘要 |
<p>A gas supply part (51) is provided in a vacuum vessel (2) so as to surround a region facing a wafer (10) so that a process gas is jetted out from the gas supply part (51) toward the wafer (10). Plasma producing microwaves are turned on and off at a frequency of 30 Hz to 500 Hz to be intermittently supplied from a radio-frequency power generating part (6) into the vacuum vessel (2). Thus, the gas remaining on the wafer (10) is replaced with a new process gas while the microwaves are turned on. Thus, the difference in degree of dissociation between the central portion and peripheral portion of the wafer (10) is not so great to uniformly carry out a plasma process. <IMAGE></p> |
申请公布号 |
EP1119033(A1) |
申请公布日期 |
2001.07.25 |
申请号 |
EP19990943392 |
申请日期 |
1999.09.17 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
ISHII, NOBUO;FUKIAGE, NORIAKI;AKAHORI, TAKASHI |
分类号 |
C23C16/511;C23C16/515;H01J37/32;(IPC1-7):H01L21/31;H01L21/316;H01L21/318 |
主分类号 |
C23C16/511 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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