发明名称 |
Narrow beam ArF excimer laser device |
摘要 |
<p>The invention relates to a semiconductor exposure ArF excimer laser device having a narrow line width containing 95 % of the energy of 1.15 pm or less while using an optical system of prior art beam expansion prisms and a diffraction grating. The ArF excimer laser device for narrowing the bandwidth has a line-narrowing optical system comprised of an echelle diffraction grating 3 in a Littrow arrangement, a beam expansion prism system composed of at least three prisms arranged on the incident side of the echelle diffraction grating, and slits 4. The blaze angle &thetas; of the diffraction grating 3 is 82 DEG or less, the magnification rate M of the beam expansion prism system is 26 times or less, the oscillation pulse width Tis is 60 ns or less, the length L of the resonator is in a range of 1000 to 1350 mm and the slit width W is 1.0 mm or more, satisfying relation (W + 11) cos&thetas;/(LMTis<0.853>) < 4.94 x 10<-6> . <IMAGE></p> |
申请公布号 |
EP1119083(A2) |
申请公布日期 |
2001.07.25 |
申请号 |
EP20010100849 |
申请日期 |
2001.01.15 |
申请人 |
USHIODENKI KABUSHIKI KAISHA |
发明人 |
TADA, AKIFUMI;IGARASHI, TATUSHI |
分类号 |
G02B5/18;G03F7/20;H01L21/027;H01S3/08;H01S3/1055;H01S3/225;(IPC1-7):H01S3/08 |
主分类号 |
G02B5/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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