发明名称 PROGRAM EXECUTION SYSTEM FOR SEMICONDUCTOR TESTING DEVICE
摘要 PURPOSE: To provide the program execution system of a semiconductor device for quickening an executing speed, and for supporting the learning of general-pur pose programming language, and for improving the transplanting performance of a program. CONSTITUTION: A semiconductor testing device 100 is provided with a tester processor 100, a tester main body 20, and a test head 30. The tester processor 10 for controlling the operation of the tester main body 20 is provided with a kernel 11, programs 12 and 13, an emulator 14 for execution, an emulator 15 for IO control, and a tester bus driver 16. The device test program is constituted of a program 12 described in general-purpose programming language and a program 13 described in programming language exclusive for semiconductor test.
申请公布号 KR20010070401(A) 申请公布日期 2001.07.25
申请号 KR20010000297 申请日期 2001.01.04
申请人 ADVANTEST CORPORATION 发明人 YAMASHITA YASUYOSHI
分类号 G01R31/28;G01R31/3183;G01R31/319;G06F11/22;G11C29/56;(IPC1-7):H01L21/66 主分类号 G01R31/28
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