| 摘要 |
The invention relates to electronic technique, particularly to technology of fabricating and checking semiconductor integrated circuits and semiconductor structures. The method of manufacturing and checking electronic components consists in that a plurality of dice are disposed in a press-form, orienting to the dice bonding pads and base elements of the press-form, all non-protected surfaces of the dice except the bonding pads are insulated. Specificity of the method consists in that disposing in the press-form dice are fixed one to another forming a group carrier, providing a disposal of the dice facial (main) surfaces on common plane with one of the group carrier's surfaces, at that all the conductors, necessary for burn-in and checking, and also external connector are deposited on this plane simultaneously. Variants of the method consist in that a group metal frame is disposed simultaneously with the dice. The group carrier can be also formed by a flexible printed circuit board, connected to a hard base. |
