| 发明名称 |
Semiconductor material classification device |
| 摘要 |
A device for the optoelectronic classification of semiconductor materials, which has an identifying device 6 that forwards the morphology of the product 1 to be classified to an evaluating device 7 which evaluates the data.
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| 申请公布号 |
US6265683(B1) |
申请公布日期 |
2001.07.24 |
| 申请号 |
US19990388207 |
申请日期 |
1999.09.01 |
| 申请人 |
WACKER-CHEMIE GMBH |
发明人 |
FLOTTMANN DIRK;HESSE KARL;SCHANTZ MATTHäUS |
| 分类号 |
G01B11/24;B07C5/10;B07C5/36;C30B15/02;G01B11/245;(IPC1-7):B07C5/00 |
主分类号 |
G01B11/24 |
| 代理机构 |
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