| 摘要 |
A semiconductor test circuit and a method for testing a liquid crystal display device which includes a substrate, first and second busses, signal lines, and first and second switching circuits. The test circuit includes driver circuits configured to drive the first and second semiconductor switching circuits simultaneously and detection circuits configured to detect electric properties between the first and second busses and the first and second semiconductor switching circuits when the driver circuits drive the first and second semiconductor switching elements. The method of testing includes supplying the first and second busses with first and second voltages, driving the first and second semiconductor switching circuits to connect simultaneously the first and second busses to the signal lines, and detecting electric currents when the first and second semiconductor switching circuits are simultaneously driven, thereby checking whether at least one of the first and second semiconductor switching circuits and the busses function correctly.
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