发明名称 Sir measuring device and sir measuring method
摘要 A desired wave power detection section 10 detects desired wave power from a received signal. On the other hand, an interference wave power detection section 11 detects interference wave power from the received signal. Interference wave power before and after in time receives averaging processing over a long interval in an averaging section 12, and receives averaging processing over a short interval in an averaging section 13. A differencing device 124 obtains a difference between an averaged value over the long interval and an averaged value over the short interval. A selection section 16 selects the averaged value of the short interval in the case where the obtained difference is larger than a prescribed threshold value, and selects the averaged value of the long interval in the case where the obtained difference is smaller than the prescribed threshold value. An SIR calculation section 17 obtains a ratio of the averaged value selected by the selection section 16 to the desired wave power detected by the desired wave power detection section 10. <IMAGE>
申请公布号 AU2553801(A) 申请公布日期 2001.07.24
申请号 AU20010025538 申请日期 2001.01.15
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KENICHI MIYOSHI;KATSUHIKO HIRAMATSU
分类号 G01R29/26;H04B7/26;H04B17/00 主分类号 G01R29/26
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