发明名称 |
LITHOGRAPHIC METHOD USING HYPERFINE PROBE |
摘要 |
PROBLEM TO BE SOLVED: To develop lithographic technology allowing a hyperfine grooved pattern having a width of few nm to few hundred nm to be drawn on a sample such as a resist film, a mask formation film and a highly functional film. SOLUTION: The base end of the nano-tube 12 is fixed to a holder 8 and its end is protruded from the holder 8 to form a nano-tube probe 12. The end of the probe is arranged in contact with a sample surface and voltage E is applied between the probe and a sample to cause the probe to be moved while removing sample materials from a probe contact portion to form a grooved pattern on the sample surface. An AFM probe or an STM probe can be used as the hyperfine probe. If the sample is an organic film 4, voltage E is applied between the probe and the organic film with the probe 12 being a cathode. By using the most effective nano-tube, the width W of the groove 16 to be formed is controlled to be few nm to few hundred nm because the diameter of the nano-tube is distributed from about 1 nm to few ten nm.
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申请公布号 |
JP2001198900(A) |
申请公布日期 |
2001.07.24 |
申请号 |
JP20000050301 |
申请日期 |
2000.01.22 |
申请人 |
NAKAYAMA YOSHIKAZU;DAIKEN KAGAKU KOGYO KK |
发明人 |
NAKAYAMA YOSHIKAZU;HARADA AKIO |
分类号 |
B82B3/00;G01Q10/00;G01Q70/00;G03F7/075;G03F7/20;(IPC1-7):B82B3/00;G12B21/00 |
主分类号 |
B82B3/00 |
代理机构 |
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