发明名称 Waveform measuring apparatus and waveform obtaining method
摘要 Disclosed is a waveform measuring apparatus in which an integration period T can be discretionally set to a value in accordance with the analog voltage cycle of the device being measured with a simple circuit configuration. The waveform measuring apparatus has two integrator circuits for integrating a repeat-cycle analog input with a fixed period. A control portion, consisting of a gate controller and a phase shifter, enables first and second integrators alternatively, such that only one integrator is active at any point in time. The integrals from both integrators are then combined to obtain the integral of the analog input voltage.
申请公布号 US6265860(B1) 申请公布日期 2001.07.24
申请号 US20000571065 申请日期 2000.05.15
申请人 ADVANTEST CORPORATION 发明人 EGUCHI HIROSHI;SAKAMOTO KAZUO;YADA EIICHI
分类号 G01R19/25;G01R13/02;H03M1/50;(IPC1-7):G01R22/00 主分类号 G01R19/25
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