发明名称 METHOD FOR FORMING TUNGSTEN CONTACT PLUG OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a tungsten plug of a semiconductor device is provided to prevent a volcano phenomenon by using a barrier metal and a CVD(Chemical Mechanical Deposition) tungsten to form a tungsten plug. CONSTITUTION: A contact hole(110) is formed on an insulating layer(200). A titanium layer(300) is formed on the contact hole(110). A titanium nitride layer(300) is formed on the titanium layer(200). A fine tungsten layer(500) is formed on the titanium nitride layer(400) by using a CMD method. The fine tungsten layer(500) has a thickness less than 50 angstrom. A thermal process for the structure formed with the fine tungsten layer(500) is performed. The contact hole(110) is filled by laminating the tungsten layer.
申请公布号 KR20010068542(A) 申请公布日期 2001.07.23
申请号 KR20000000495 申请日期 2000.01.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JIN HO;JANG, SEONG DAE
分类号 H01L21/28;C23C16/02;C23C16/04;C23C16/08;C23C16/56;H01L21/283;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/283 主分类号 H01L21/28
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