发明名称 |
METHOD FOR FORMING TUNGSTEN CONTACT PLUG OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a tungsten plug of a semiconductor device is provided to prevent a volcano phenomenon by using a barrier metal and a CVD(Chemical Mechanical Deposition) tungsten to form a tungsten plug. CONSTITUTION: A contact hole(110) is formed on an insulating layer(200). A titanium layer(300) is formed on the contact hole(110). A titanium nitride layer(300) is formed on the titanium layer(200). A fine tungsten layer(500) is formed on the titanium nitride layer(400) by using a CMD method. The fine tungsten layer(500) has a thickness less than 50 angstrom. A thermal process for the structure formed with the fine tungsten layer(500) is performed. The contact hole(110) is filled by laminating the tungsten layer.
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申请公布号 |
KR20010068542(A) |
申请公布日期 |
2001.07.23 |
申请号 |
KR20000000495 |
申请日期 |
2000.01.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JIN HO;JANG, SEONG DAE |
分类号 |
H01L21/28;C23C16/02;C23C16/04;C23C16/08;C23C16/56;H01L21/283;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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