发明名称 |
METHOD FOR MANUFACTURING CAPACITOR |
摘要 |
PURPOSE: A method for manufacturing a capacitor is provided to obtain a high capacitance by maximizing a surface area of a lower electrode of a capacitor. CONSTITUTION: An isolation region(22) is formed on a semiconductor substrate(21). A cap insulating layer(25) covers a gate oxide layer(23) and a gate electrode(24) formed on the semiconductor substrate(21). An insulating layer(26) is deposited on the whole structure. A node contact hole is formed by a photo etching process. The node contact hole is filled by the polysilicons(27,28). An oxide layer(29) is formed thereon. The first node electrode is patterned by etching the polysilicons(27,28). The polysilicon(28) is exposed by etching the oxide layer. The second node electrode is formed by growing a GeSi polysilicon(30). The remaining oxide layer(30) is removed. A dielectric layer(31) is formed thereon. A plate electrode is formed by using a polysilicon(32).
|
申请公布号 |
KR20010068610(A) |
申请公布日期 |
2001.07.23 |
申请号 |
KR20000000619 |
申请日期 |
2000.01.07 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, JAE CHEOL;PARK, YU BAE |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|