发明名称 METHOD OF FOCUSING ELECTRON BEAM USING SHADOW MASK
摘要 PURPOSE: A method of focusing an electron beam using a shadow mask is provided to obviate a scattering of the electron beam passing through the shadow mask holes, achieve a desired focusing spot by adjusting an applied voltage, a thickness of a dielectric layer and a length between a mask and a panel. CONSTITUTION: A mask small hole is faced for an electron gun which discharge the electron beam, while a mask large hole is faced for a screen(4) in the shadow mask(1). First, a dielectric layer(2) and a metallic layer(3) are formed on the shadow mask(1) to be formed a complete screen by reaching the electron beam to the screen(4) by focusing the electron beam passed through a hole of the shadow mask(1). Then, a low potential(V1) is applied to the screen(4) and the metallic layer(3), while a high potential(V2) which is relatively higher than the low potential(V1) is applied to the shadow mask(1).
申请公布号 KR20010068397(A) 申请公布日期 2001.07.23
申请号 KR20000000312 申请日期 2000.01.05
申请人 ORION ELECTRIC CO., LTD. 发明人 LEE, MIN SU
分类号 H01J29/46;(IPC1-7):H01J29/46 主分类号 H01J29/46
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