| 摘要 |
PROBLEM TO BE SOLVED: To inspect a short circuit between respective terminals and an imperfect soldering operation without using a high-cost apparatus and to confirm the internal operation of a semiconductor integrated circuit by a method, where a signal at the inside of the semiconductor integrated circuit can be output arbitrarily. SOLUTION: The semiconductor integrated circuit device has a structure, in which the semiconductor integrated circuit 10 is mounted on a printed circuit board 20. The integrated circuit device is provided with a selection-signal generation part 30, which generates a selection signal to be given from the outside in order to select an arbitrary signal at the inside of the semiconductor integrated circuit 10. The integrated circuit device is provided with a signal selection part 40, in which the arbitrary signal at the inside of the semiconductor integrated circuit 10 is selected on the basis of the selection signal generated by the selection-signal generation part 30 and which outputs the arbitrary signal to a specific terminal 43 at the outside of the semiconductor integrated circuit 10.
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