发明名称 METHOD AND APPARATUS FOR TEMPERATURE MEASUREMENT, AND THERMAL INFRARED IMAGE SENSOR
摘要 <p>At least one forward-biased semiconductor diode having a potential barrier is used as a temperature sensor whose sensitivity can be finely adjusted. An operational amplifier circuit (A1) is used to apply a bias voltage of DC or rectangular waveform to a semiconductor diode (D) having a potential barrier used as a temperature sensor. In view of the fact that the temperature sensitivity of the semiconductor diode (D) depends on the height of its potential barrier, the forward bias voltage applied from a bias circuit (2) directly to the semiconductor diode (D) is finely adjusted to obtain desired temperature sensitivity. The output voltage of the sensor is associated with a current, having an exponential temperature dependence, which flows in the semiconductor diode (D) with the forward bias being fixed.</p>
申请公布号 WO2001051902(P1) 申请公布日期 2001.07.19
申请号 JP2001000080 申请日期 2001.01.11
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