| 摘要 |
A modular offset Automated Testing equipment (ATE) test head with split backplane is presented. The ATE test head is modularized into a card cage module having a first backplane for accommodating general purpose instrument cars and a cassette module having a second backplane that is offset relative to the first backplane for accommodating personality (specific purpose) instrument cards. The general purpose instrument cards and the personality instrument cards communicates with each other by cables connecting them. The general purpose instrument cards and personality instrument cards can be quickly disengaged form and engaged to the respective backplanes individually or concurrently. Because of this latter feature, a cassette module can be easily and rapidly disengaged form the card cage module and a different cassette module can be easily and rapidly engaged to the card cage module. In so doing, the test head can be easily and rapidly reconfigured to perform different test functions without any ATE down time. When attached to the card cage, the cassette module extends beyond the card cage's boundary along one direction to form a platform. This platform provides the interface to a Device Under Test (DUT) board. As a result of the modularity of the three major elements: card cage, cassette module, and split backplanes that together form a ATE test head, rapid and accurate attachment to and removal form a variety of IC handlers and probers are facilitated.
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