发明名称 APPARATUS AND METHOD FOR MOUNTING INSPECTION
摘要 <p>PROBLEM TO BE SOLVED: To shorten the testing time even for a plurality of test cards by reducing the labor of a preparation for performing a boundary scan test required by each testing card. SOLUTION: The mounting inspection apparatus is provided with a plurality of slots 102a to 102n, in which a plurality of test cards 104a to be inspected for mounting are stored, so as to be freely inserted and pulled out and by which the plurality of stored test cards 104a can be connected arbitrarily to connectors. The mounting inspection apparatus is provided with a jig part 103, which is wired and connected to the respective slots 102a to 102n through the connectors and which outputs a mounting inspection signal to the cards 104a connected to the connectors through their interconnections. A series of treatments, in which the plurality of cards 104a are inserted once into the respective slots 102a to 102n, in which one out of them is connected to the connectors, in which an inspection signal is generated so as to perform mounting inspection and in which the plurality of cards 104a, after the mounting inspection are removed from the connectors, are repeated, and all the cards 104a are inspected for mounting.</p>
申请公布号 JP2001194429(A) 申请公布日期 2001.07.19
申请号 JP20000007691 申请日期 2000.01.17
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMAZAKI TAKASHI
分类号 G01R31/28;G06F1/18;H05K3/00;(IPC1-7):G01R31/28 主分类号 G01R31/28
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