发明名称 METHOD OF PREPARING A SEMICONDUCTOR SUBSTRATE FOR SUBSEQUENT SILICIDE FORMATION
摘要 A method for preparing a semiconductor substrate for subsequent silicide formation. In one embodiment, the present invention subjects the semiconductor substrate to an ashing environment. In the present embodiment, the ashing environment is comprised of H>2<O vapor, and a gaseous fluorocarbon or a fluorinated hydrocarbon gas. In so doing, contaminants on the semiconductor substrate are removed. Next, the present invention subjects a mask covering a polysilicon stack to a mask-removal ashing environment. In the present embodiment, the mask-removal ashing environment is comprised of an O>2< plasma. In so doing, the mask covering the polysilicon stack is removed. As a result, the semiconductor substrate and the top surface of the polysilicon stack are prepared for subsequent silicide formation thereon.
申请公布号 WO0152311(A2) 申请公布日期 2001.07.19
申请号 WO2001US00854 申请日期 2001.01.10
申请人 PHILIPS SEMICONDUCTORS, INC.;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 YEH, EDWARD, K.;GABRIEL, CALVIN, TODD;SENGUPTA, SAMIT
分类号 H01L21/28;G03F7/42;H01L21/027;H01L21/304;H01L21/3065;H01L21/311;(IPC1-7):H01L21/321 主分类号 H01L21/28
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