发明名称 |
METHOD OF PREPARING A SEMICONDUCTOR SUBSTRATE FOR SUBSEQUENT SILICIDE FORMATION |
摘要 |
A method for preparing a semiconductor substrate for subsequent silicide formation. In one embodiment, the present invention subjects the semiconductor substrate to an ashing environment. In the present embodiment, the ashing environment is comprised of H>2<O vapor, and a gaseous fluorocarbon or a fluorinated hydrocarbon gas. In so doing, contaminants on the semiconductor substrate are removed. Next, the present invention subjects a mask covering a polysilicon stack to a mask-removal ashing environment. In the present embodiment, the mask-removal ashing environment is comprised of an O>2< plasma. In so doing, the mask covering the polysilicon stack is removed. As a result, the semiconductor substrate and the top surface of the polysilicon stack are prepared for subsequent silicide formation thereon.
|
申请公布号 |
WO0152311(A2) |
申请公布日期 |
2001.07.19 |
申请号 |
WO2001US00854 |
申请日期 |
2001.01.10 |
申请人 |
PHILIPS SEMICONDUCTORS, INC.;KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
YEH, EDWARD, K.;GABRIEL, CALVIN, TODD;SENGUPTA, SAMIT |
分类号 |
H01L21/28;G03F7/42;H01L21/027;H01L21/304;H01L21/3065;H01L21/311;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|