发明名称 DEFECTIVE CONDITION DISPLAY DEVICE, AND ITS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defective condition display method capable of quantitatively displaying defects inside a specimen. SOLUTION: This defective condition display method comprises a step of detecting the information on the sound wave from the specimen by irradiating the ultrasonic on the specimen, a step of detecting a defect from the information on the detected sound wave, a step of registering the position of the detected defect on layers 1, 2,... divided at each predetermined depth, and a step of connecting the defects in which the registered positions of the defects overlap or are adjacent to each other.
申请公布号 JP2001194351(A) 申请公布日期 2001.07.19
申请号 JP20000001607 申请日期 2000.01.07
申请人 NISSAN MOTOR CO LTD 发明人 KOHARI YUJI
分类号 G01N29/44;G01N29/22 主分类号 G01N29/44
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