发明名称 SEMICONDUCTOR FILM AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance the orientational property of a crystalline semiconductor film, which is made of an amorphous semiconductor film using a thermal crystallization method or a laser crystallization method, and moreover, to raise the characteristics of a TFT by using such the crystalline semiconductor film and to reduce an irregularity in the characteristics of the TFT. SOLUTION: The manufacturing method of a semiconductor device comprises a first process that a first insulating film 1102a is formed on a substrate 1101, a second process that an amorphous semiconductor film 1102b is formed on the first insulating film 1102a, a third process that fluorine is implanted in the amorphous semiconductor film 1102b from the surface of the amorphous semiconductor film 1102b, a fourth process that a catalyst element to accelerate a crystallization of the film 1102b is added to the film 1102b in the film 1102b or in contact to the film 1102b, a fifth process that the film 1102b is subjected to a first heating treatment and a crystalline semiconductor film 1103 is formed and a sixth process that the crystalline semiconductor film 1103 is irradiated with laser beam to increase the crustallinity of the crystalline semiconductor film 1103.
申请公布号 JP2001196306(A) 申请公布日期 2001.07.19
申请号 JP20000002028 申请日期 2000.01.07
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;ARAI YASUYUKI
分类号 G09F9/30;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 G09F9/30
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