发明名称 DEVICE AND METHOD FOR FLAW DETECTION
摘要 PROBLEM TO BE SOLVED: To provide a device and a method for flaw detection, little affected by disturbing light such as sunlight, capable of discriminating through flaws such as holes and cracks from dirt, recesses, rust, and the like, capable of performing detection without stopping a moving container, capable of detecting small flaws with high accuracy, and little consuming electric power. SOLUTION: This device is equipped with a pulse light source 12 for emitting short pulse light 11, a light transmitting device 14 for transmitting the pulse light to irradiate an inspected surface 13 with higher illuminance than its periphery receives, a CCD camera 16 for taking a picture of the inspected surface in synchronization with the light source, and the device 18 for flaw detection for comparing the illuminance of a dark part in the taken picture with a prescribed threshold and, if lower, issuing a flaw detection signal.
申请公布号 JP2001194318(A) 申请公布日期 2001.07.19
申请号 JP20000005368 申请日期 2000.01.14
申请人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD;NYK LOGISTICS TECHNOLOGY INSTITUTE 发明人 IWASAKI ITARU;YAGI TAKETO;TANIDA KOJI;OKAMURA HISAAKI;HOSAKA HARUYUKI;TAMURA KENJI;ITO ISAO;YAMASHITA ICHIRO
分类号 G01N21/95;G01N21/84;(IPC1-7):G01N21/95 主分类号 G01N21/95
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