发明名称 CONTACT PROBE
摘要 <p>PROBLEM TO BE SOLVED: To restrain the degradation of signal property and electric resistance. SOLUTION: In a contact probe 20, a contact pin 2ag and a metal film layer 6 to form a ground layer of a film 4 among protruding contact pins 2a from the film 4 are connected by a ribbon-formed bonding member 21. The ribbon- formed bonding member 21 is installed at the outside of the film 4.</p>
申请公布号 JP2001196114(A) 申请公布日期 2001.07.19
申请号 JP20000004932 申请日期 2000.01.13
申请人 MITSUBISHI MATERIALS CORP 发明人 SUETSUGU TAKUZO;IWAMOTO TAKAFUMI;ASO TAKESHI
分类号 H01R4/58;(IPC1-7):H01R12/32 主分类号 H01R4/58
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