发明名称 MIS transistor and manufacturing method thereof
摘要 This invention provides a MIS transistor with less electrical short between a gate and source/drain electrodes. A sidewall spacer 15 has a two-layer structure including a buffer layer 13 which consists of nitrided oxide silicon and a silicon nitrided layer 14 formed on the buffer layer 13. The sidewall spacer 15 serves as a mask to form a silicide film 10.
申请公布号 US2001008293(A1) 申请公布日期 2001.07.19
申请号 US20010769400 申请日期 2001.01.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHIMIZU SATOSHI;ODA HIDEKAZU
分类号 H01L21/28;H01L21/336;H01L29/45;H01L29/49;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/28
代理机构 代理人
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