发明名称 |
MIS transistor and manufacturing method thereof |
摘要 |
This invention provides a MIS transistor with less electrical short between a gate and source/drain electrodes. A sidewall spacer 15 has a two-layer structure including a buffer layer 13 which consists of nitrided oxide silicon and a silicon nitrided layer 14 formed on the buffer layer 13. The sidewall spacer 15 serves as a mask to form a silicide film 10.
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申请公布号 |
US2001008293(A1) |
申请公布日期 |
2001.07.19 |
申请号 |
US20010769400 |
申请日期 |
2001.01.26 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
SHIMIZU SATOSHI;ODA HIDEKAZU |
分类号 |
H01L21/28;H01L21/336;H01L29/45;H01L29/49;H01L29/78;(IPC1-7):H01L29/76 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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