AN ALGORITHMIC TEST PATTERN GENERATOR, WITH BUILT-IN-SELF-TEST (BIST) CAPABILITIES, FOR FUNCTIONAL TESTING OF A CIRCUIT

摘要

A test system includes a test data generator (30) to provide test data (e.g., a test pattern) to a subject circuit (e.g., a digital television video circuit). The test data functionally verifies the subject circuit. The functional verification of the subject is performed utilizing an output of the subject circuit generated responsive to the test data in accordance with the operational functionality of the subject circuit. The test data generator is also coupled to provide the test data to a built-in self-test (BIST) circuit (46 and 56) so as to enable the built-in self-test circuit to receive the test data concurrently with the provision thereof to the subject circuit, and to perform a built-in self-test utilizing the test data. The test data generator and the built-in self-test circuit may be implemented within an integrated functional block included within an integrated circuit.