| 摘要 |
PROBLEM TO BE SOLVED: To provide a device, for tester inspection, by which whether a voltage and a signal are supplied normally to a device to be evaluated can be determined simply, by using a tester for a prescribed semiconductor integrated circuit device. SOLUTION: The device for tester inspection has the outer shape of a package, which is nearly identical to that of a semiconductor integrated circuit device to be evaluated by the tester. The device has the arrangement structure of an external terminal, which is nearly identical to that of the semiconductor integrated-circuit device. The device can be connected to the tester in the same manner as the semiconductor integrated circuit device. A resistance which has a prescribed resistance value is installed across the power-supply terminal and the grounding terminal of the device. In a state where a device body is connected to the tester and that a power-supply voltage is applied to the power-supply terminal, a current expected value, across the power-supply terminal and the grounding terminal, which is calculated approximately on the basis of the value of the power-supply voltage to be applied and on the basis of the resistance value of the resistance, is compared with a measured current value. Whether the power-supply voltage which is applied by the tester is normal is determined.
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