| 摘要 |
PROBLEM TO BE SOLVED: To provide a jig for an automatic sorting apparatus used in IC tests which can open latch devices of a tray, when a pressuring device for bringing an IC and its terminals into contact with a test base is used. SOLUTION: This jig for the automatic sorting apparatus for IC tests includes the tray 10, having a recess part for storing the IC with the terminals to be tested and at least two long holes formed to a bottom face of the recess part, at least two storable latch devices 24 partially projecting into the recess part, a movable plate 14 set on the tray for controlling to store the latch devices, a pressuring device 40 having a projecting part to a bottom part for inserting the terminals of the IC through the long holes when the test is carried out, and at least two pressuring rods 60 set to the pressuring device for pressing the movable plate, before the pressuring device presses the IC and bringing the latch devices into an open state, while being stored.
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