发明名称 METAL ION DETECTING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a new metal ion detecting method and device which can implement the quantitative analysis of a trace of metal ions with high accuracy while having a low limit of detection. SOLUTION: In this metal ion detecting device comprising a cell 20 having a pipe-like reaction tube 22, sample inlet pipes 23a, 23b and a sample outlet pipe 28, a sensor to measure the light quantity of the emitted light, and a controller which processed the measured light quantity to obtain the concentration of the metal ions, the sample containing luminol and hydrogen peroxide and the sample containing the metal ions are continuously introduced in each independent predetermined space, each of the introduced samples is moved along the path in the predetermined spaces so that the samples are met to simultaneously mixed and reacted with each other to emit the light having the predetermined wavelength, the reacted sample is discharged, the intensity of the emitted light is measured, and the measured light quantity is processed to obtain the concentration of the metal ions.
申请公布号 JP2001194358(A) 申请公布日期 2001.07.19
申请号 JP20000375839 申请日期 2000.12.11
申请人 SELIGHT CO LTD 发明人 JUNG DONG KEUN
分类号 G01N31/00;G01N21/76;G01N21/78;(IPC1-7):G01N31/00 主分类号 G01N31/00
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