Method and testing system for measuring contact resistance for pin of integrated circuit

摘要

A method and a testing system for measuring contact resistance of a pin on an integrated circuit. An RC circuit is coupled to the integrated circuit, and a response signal of a testing signal input to the integrated circuit is monitored. The response signal has a time dependent voltage V'. Another time dependent voltage V1 for the testing signal through the RC circuit and a voltage drop across an internal circuit of the integrated circuit is illustrated. Comparing V' with V1, whether the contact resistance of the pin being tested is allowable can be determined according to the ratings or specification of the integrated circuit.